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 FZT649
Discrete Power & Signal Technologies July 1998
FZT649
C E
B
C
SOT-223
NPN Low Saturation Transistor
These devices are designed with high current gain and low saturation voltage with collector currents up to 3A continuous.
Absolute Maximum Ratings*
Symbol VCEO VCBO VEBO IC TJ, Tstg Parameter Collector-Emitter Voltage Collector-Base Voltage Emitter-Base Voltage Collector Current - Continuous
TA = 25C unless otherwise noted
FZT649 25 35 5 3 -55 to +150
Units V V V A C
Operating and Storage Junction Temperature Range
*These ratings are limiting values above which the serviceability of any semiconductor device may be impaired. NOTES: 1) These ratings are based on a maximum junction temperature of 150C. 2) These are steady state limits. The factory should be consulted on applications involving pulsed or low duty cycle operations.
Thermal Characteristics
Symbol
TA = 25C unless otherwise noted
Max Characteristic FZT649 PD RJA Total Device Dissipation Thermal Resistance, Junction to Ambient 2 62.5 W C/W Units
(c) 1998 Fairchild Semiconductor Corporation
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FZT649.lwpPrNC 7/10/98 revB
FZT649
NPN Low Saturation Transistor
(continued)
Electrical Characteristics
Symbol Parameter
TA = 25C unless otherwise noted
Test Conditions
Min
Max
Units
OFF CHARACTERISTICS BVCEO BVCBO BVEBO ICBO Collector-Emitter Breakdown Voltage Collector-Base Breakdown Voltage Emitter-Base Breakdown Voltage Collector Cutoff Current IC = 10 mA IC = 100 A IE = 100 A VCB = 30 V VCB = 30 V, TA=100C IEBO Emitter Cutoff Current VEB = 4V 25 35 5 100 10 100 V V V
nA uA nA
ON CHARACTERISTICS* hFE DC Current Gain IC = 50 mA, VCE = 2 V IC = 1 A, VCE = 2 V IC = 2 A, VCE = 2 V IC = 6 A, VCE = 2 V VCE(sat) Collector-Emitter Saturation Voltage IC = 1 A, IB = 100 mA IC = 3 A, IB = 300 mA VBE(sat) VBE(on) Base-Emitter Saturation Voltage Base-Emitter On Voltage IC = 1 A, IB = 100 mA IC = 1 A, VCE = 2 V 70 100 75 15 300 600 1.25 1 V V mV 300 -
SMALL SIGNAL CHARACTERISTICS Cobo fT Output Capacitance Transition Frequency VCB = 10 V, IE = 0, f = 1MHz IC = 100 mA,VCE = 5 V, f=100MHz 150 50 pF -
*Pulse Test: Pulse Width 300 s, Duty Cycle 2.0%
(c) 1998 Fairchild Semiconductor Corporation
Page 2 of 2
FZT649.lwpPrNC 7/10/98 revB
(c) 1998 Fairchild Semiconductor Corporation
Page 3 of 2
FZT649.lwpPrNC 7/10/98 revB


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